Test and Measurement Day is taking place on Wednesday, June 11, 2014 n Paris at the Cité des Sciences et de l’Industrie (La Villette)

Program highlights

10h-10h45 Conference: TEST – Test cards: JTAG takes off

11h-12h15 Maintenance and Metrology – Conference in collaboration with the French College of Metrology

14h-14h45 Conference: TEST – Challenges for RF test objects

14-15h conference Directives, CE marking and regulatory standards applicable to T&M equipment