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SKU
143308
Tektronix TAP2500 Active Probe, 2 .5 GHzThe Tektronix TAP2500 single-ended Active FET Probe is a versatile and easy to use probe that provides high-speed electrical and mechanical performance needed for digital system designs. The Tektronix TAP2500 Probe is designed specifically for use and connection to TekVPI™ probe interface.Features and Specifications of the Tektronix TAP2500 Active Probe include: Features: Specifications: Provides high-speed signal acquisition and measurement fidelity: Connects directly to Oscilloscope with the TekVPI™ probe interface Provides automatic units scaling and readout on the Oscilloscope display Easy access to Oscilloscope probe menu display: Remote GPIB/USB probe control through the Oscilloscope Applications: Lower DUT loading effects with ≤1 pF input capacitance and 1 MΩ input resistance DUT attachment accessories provide versatile DUT connectivity for attaching to small SMDs Preserves instrument bandwidth at the probe tip for ≤1 GHz Oscilloscopes for probe status/diagnostic information to control probe DC offset Verification, debug, and characterization of high-speed designs Signal integrity, jitter, and timing analysis Manufacturing engineering and test Educational research Signals with voltage swings up to 8 Vpk-pk High Probe Bandwidth: ≥2.5 GHz Probe Attenuation: 10:1 Fast Probe Rise Time: Input Capacitance: ≤0.8 pF Input Resistance: 40 kΩ Input Dynamic Range: –4 V to +4 V Input Offset Range: –10 V to +10 V Max Input Voltage (nondestruct): ±30 V (DC + peak AC) Propagation Delay: 5.3 ns
- Provides high-speed signal acquisition and measurement fidelity:
- Lower DUT loading effects with ≤1 pF input capacitance and 1 MΩ input resistance
- DUT attachment accessories provide versatile DUT connectivity for attaching to small SMDs
- Preserves instrument bandwidth at the probe tip for ≤1 GHz Oscilloscopes
- Connects directly to Oscilloscope with the TekVPI™ probe interface
- Provides automatic units scaling and readout on the Oscilloscope display
- Easy access to Oscilloscope probe menu display:
- for probe status/diagnostic information
- to control probe DC offset
- Remote GPIB/USB probe control through the Oscilloscope
- Applications:
- Verification, debug, and characterization of high-speed designs
- Signal integrity, jitter, and timing analysis
- Manufacturing engineering and test
- Educational research
- Signals with voltage swings up to 8 Vpk-pk
- High Probe Bandwidth: ≥2.5 GHz
- Probe Attenuation: 10:1
- Fast Probe Rise Time:
- Input Capacitance: ≤0.8 pF
- Input Resistance: 40 kΩ
- Input Dynamic Range: –4 V to +4 V
- Input Offset Range: –10 V to +10 V
- Max Input Voltage (nondestruct): ±30 V (DC + peak AC)
- Propagation Delay: 5.3 ns
- Lower DUT loading effects with ≤1 pF input capacitance and 1 MΩ input resistance
- DUT attachment accessories provide versatile DUT connectivity for attaching to small SMDs
- Preserves instrument bandwidth at the probe tip for ≤1 GHz Oscilloscopes
- for probe status/diagnostic information
- to control probe DC offset
- Verification, debug, and characterization of high-speed designs
- Signal integrity, jitter, and timing analysis
- Manufacturing engineering and test
- Educational research
- Signals with voltage swings up to 8 Vpk-pk
Returns
If you are not completely satisfied with your purchase, simply return the item to us in its original condition within 30 days of receipt.
Returned items should be unused and must be returned in original packaging with any enclosed documentation. We will issue a full refund on receipt, excluding the original delivery charge. Alternatively, if preferred, we will exchange the item.
VAT
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Where VAT is charged, a rate of 23% is applied.
VAT is not charged outside of the EU.
