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Keithley 4200A-SCS

Système de caractérisation d'analyseur de paramètres semi-conducteur

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Modèle: Keithley 4200A-SCS
Description: Système de caractérisation d'analyseur de paramètres semi-conducteur
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Keithley 4200A-SCSThe Keithley 4200A-SCS Semiconductor Parameter Analyser Characterization System performs lab grade DC and pulse device characterization, real-time plotting, and analysis with high precision and sub-fem to amp resolution. The Keithley 4200A-SCS delivers synchronizing cur-voltage (I-V), capacitance-voltage (C-V) and ultra-fast pulsed I-V measurements.The Keithley 4200A-SCS Parameter Analyser reduces characterization complexity and test setup by up to 50%, providing clear, uncompromised measurement and analysis capability. Plus, embedded measurement expertise—an industry first—provides test guidance and gives you supreme confidence in your results.Highlights of the Keithley 4200A-SCS Semiconductor Parameter Analyser include:

  • Built-in measurement VIDEOS in English, Chinese, Japanese, and Korean
  • Jump start your testing with over 450 user-modifiable application tests
  • Automated real-time parameter extraction, data graphing, arithmetic functions
  • The 4200A-CVIV Multi-Switch automatically switches between I-V and C-V measurements without re-cabling or lifting the prober tips. Unlike competing products, the four-channel 4200A-CVIV display provides local visual insight for quick test setup and easy troubleshooting when unexpected results occur.
    • Move C-V measurement to any device terminal without re-cabling
    • User-configurable for low cur capability
    • Personalize the names of output channels
    • View real-time test status
  • Move C-V measurement to any device terminal without re-cabling
  • User-configurable for low cur capability
  • Personalize the names of output channels
  • View real-time test status

    • Features of the Keithley 4200A-SCS system include:

  • Intuitive, touch-screen interface running Clarius SWon Win7 embedded computer.
  • Unique Optional Remote PreAmps extend the resolution of SMUs to 10 aA 
  • C-V instrument makes C-V measurements as easy as DC I-V
  • Pulse and pulse I-V capabilities for advanced semiconductor testing
  • Scope card provides integrated scope and pulse measure functionality
  • Self-contained PC provides fast test setup, powerful data analysis, graphing and printing, and on-board mass storage of test results.  
  • Furnished with embedded measurement expertise and hundreds of ready-to-use application tests,
  • Built-in stress/measure, looping, and data analysis for point-and-click reliability testing, including five JEDEC compliant sample tests
  • Integrated support for a variety of LCR meters, Keithley switch matrix configurations, and both Keithley Series 3400 and Agilent 81110 pulse generators
  • Includes software drivers for leading analytical probers

    • SPecifications of the 4200A-SCS include:

  • Cur-Voltage (I-V) Range: 
    • 0.1 fA – 1 A
    • 0.2 µV – 210 V
  • Capacitance-Voltage (C-V) Range: 1 kHz – 10 MHz ± 30V DC bias
  • Pulsed I-V Range: ±40 V (80 V p-p), ±800 mA 200 MSa/sec, 5 ns sampling rate
  • 0.1 fA – 1 A
  • 0.2 µV – 210 V

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    Keithley

    Keithley 4200A-SCS Product Overview