Keysight B1510A (Agilent)Source/Measure Units (SMUs), such as the Keysight B1510A (Agilent), are the key measurement modules of the Agilent / Keysight B1500A Semiconductor Device Parameter Analyser. The SMUs integrate voltage/cur source and measurement capabilities into a module, and it enables accurate DC cur-voltage (IV) measurement with down to fA / µV resolution. The low cur measurement performance can be expanded down to sub-fA level by the optional ASU (Atto sense switch unit) if you need more measurement performance.The B1510A can also perform the Quasi-Static Capacitance-Voltage (QS-CV) measurement. It is a measurement method to obtain low frequency CV characteristics, and it is important to characterize the surface state of the gate of transistor as well as high frequency CV. Keysight B1500A enables accurate QS-CV measurement with the leak cur compensation.Along with analysis and data management capability of EasyEXPERT software, it is very powerful and useful to perform characterization for semiconductor, nano devices such as carbon nanotube (CNT) and carbon nanowire (CNW), active/passive component, material and any electric devices that require accurate and precise voltage/cur measurement.Features and specifications of the Keysight B1510A (Agilent) include:

• Keysight (Agilent) B1510A - Datasheet (2 MB)