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Keithley 4200-SCS

Sistema de caracterización del analizador de parámetros semiconductores

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Modelo: Keithley 4200-SCS
Descripción: Sistema de caracterización del analizador de parámetros semiconductores
Hoja de datos PDF: Keithley 4200-SCS
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Keithley 4200-SCSThe Keithley 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time plotting, and analysis with high precision and sub-fem to amp resolution. The Keithley 4200-SCS offers the most advanced capabilities available in a fully integrated characterization system, including a complete, embedded PC with Windows operating system and mass storage. Its self-documenting, point-and-click interface speeds and simplifies the process of taking data, so users can begin analyzing their results sooner. Additional features enable stress-measure capabilities suitable for a variety of reliability tests as well as provide precision measurement and high resolution with LCR meter support.Features of the Keithley 4200 system include:

  • Intuitive, point-and-click Windows®-based environment
  • Unique Remote PreAmps extend the resolution of SMUs to 0.1fA
  • C-V instrument makes C-V measurements as easy as DC I-V
  • Pulse and pulse I-V capabilities for advanced semiconductor testing
  • Scope card provides integrated scope and pulse measure functionality
  • Self-contained PC provides fast test setup, powerful data analysis, graphing and printing, and on-board mass storage of test results
  • Unique browser-style Project Navigator organizes tests by device type, allows access to multiple tests, and provides test sequencing and looping control
  • Built-in stress/measure, looping, and data analysis for point-and-click reliability testing, including five JEDEC compliant sample tests
  • Integrated support for a variety of LCR meters, Keithley switch matrix configurations, and both Keithley Series 3400 and Agilent 81110 pulse generators
  • Includes software drivers for leading analytical probers

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    Keithley 4200-SCS Product Overview

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