The high power Keithley 2651A SourceMeter is specifically designed to characterize and test high power electronics and it can help you improve productivity in applications across the R&D, reliability, and production spectrums, including high brightness LEDs, power semiconductors, DC-DC converters, batteries, and other high power materials, components, modules, and subassemblies.The Keithley 2651A SourceMeter offers a highly flexible, four quadrant voltage and cur source/load coupled with precision voltage and cur meters. It can be used as a:
Semiconductor characterization instrument
V or I waveform generator
V or I pulse generator
Precision power supply
True cur source
Digital multimeter (DCV, DCI, ohms, and power with 5½-digit resolution)
Precision electronic load
Features and Specifications of the Keithley 2651A System SourceMeter include:
Source or sink:
- 2,000W of pulsed power (±40V, ±50A)
- 200W of DC power (±10V@±20A, ±20V@±10A, ±40V@±5A)
- Up to 50A @ 40V with pA and uV Resolutiion
Easily connect two units (in series or parallel) to create solutions up to ±100A or ±80V
1pA resolution enables precise measurement of very low leakage curs
1µs per point (1MHz), continuous 18-bit sampling, accurately characterizes transient behavior
1% to 100% pulse duty cycle for pulse width modulated (PWM) drive schemes and device specific drive stimulus
Combines all in one instrument:
- a precision power supply
- cur source
- DMM
- arbitrary waveform generator
- V or I pulse generator
- measurement
- electronic load
- and trigger controller
Ability to be used as either a bench-top I-V characterization tool or as a building block component of multiple-channel I-V test systems
TSP Express software to quickly and easily perform common I-V tests without programming or installing software
LabVIEW® driver
ACS Basic Edition software for semiconductor component characterization (optional). ACS Basic now features a Trace mode for generating a suite of characteristic curves.
Keithley’s Test Script Processor (TSP®):
- enables creation of custom user test scripts to further automate testing
- supports the creation of programming sequences that allow the instrument to operate asynchronously without direct PC control
Parallel test execution and precision timing when multiple Series 2600A instruments are connected together in a system
LXI class C compliance
14 digital I/O lines for direct interaction with probe stations, component handlers, or other automation tools
USB port for extra data and test program storage via USB memory device
Applications:
- Power semiconductor, HBLED, and optical device characterization and testing
- Characterization of GaN, SiC, and other compound materials and devices
- Semiconductor junction temperature characterization
- High speed, high precision digitization
- Electromigration studies
- High cur, high power device testing
2,000W of pulsed power (±40V, ±50A)
200W of DC power (±10V@±20A, ±20V@±10A, ±40V@±5A)
Up to 50A @ 40V with pA and uV Resolutiion
a precision power supply
cur source
DMM
arbitrary waveform generator
V or I pulse generator
measurement
electronic load
and trigger controller
enables creation of custom user test scripts to further automate testing
supports the creation of programming sequences that allow the instrument to operate asynchronously without direct PC control
Power semiconductor, HBLED, and optical device characterization and testing
Characterization of GaN, SiC, and other compound materials and devices
Semiconductor junction temperature characterization
High speed, high precision digitization
Electromigration studies
High cur, high power device testing