The Anritsu MP1800A Signal Quality Analyser is an expandable plug-in modular BERT with built-in Pulse Pattern Generator (PPG) supporting output of high-quality, high-amplitude signals, Error Detector (ED) with high input sensitivity supporting signal analysis, such as Bathtub Jitter and Eye Diagram Measurements, plus a jitter modulation source for generating various jitters, such as SJ/RJ/BUJ/SSC, and supporting Jitter Tolerance tests.
The Anritsu MP1800A supports wideband bit rates from 0.1 to 32.1 Gbit/s for versatile signal integrity analysis applications up to 32 Gbit/s, such as 100GbE (25G x 4), OTU-4 (28G x 4), 32G DP-QPSK, CEI-28G, 32G FC, and Infiniband EDR (26 G). Combination with the Anritsu MP1821A and the Ansritsu MP1822A supports BER tests up to 56 Gbit/s for next-generation R&D, including CEI-56G-VSR.
1, 2, or 4 channels can be selected per PPG or ED module, supporting multi-channel synchronisation for up to 8 channels at 32 Gbit/s. AOC, QSFP+, CXP and CFP modules can be measured simultaneously, and crosstalk and skew tolerance can be evaluated.
Combined use with the Anritsu MP1825B 4Tap Emphasis generates 2 and 3-tap pre-emphasis signals for high-speed interconnects up to 32.1 Gbit/s, such as CEI-28G, 32G FC and Infiniband EDR (26G), as well as 4-tap signals. The pre-emphasis effect is easily confirmed because each tap can be changed independently.
Installing the Anritsu MP1825B 4Tap emphasis as a remote head for the Anritsu MP1800A close to the DUT keeps cables short and signal quality high. Precision signal integrity analysis is supported by pre-emphasis corrected accurate Jitter Tolerance tests with transparent input data and clock jitter .
The all-in-one Anritsu MP1800 series outputs high-amplitude signals up to 3.5 Vp-p for evaluation of EA and EML modulators, improving optical modulator R&D, line productivity, and quality.
With support for optical interfaces, the Anritsu MP1800A is ideal for IEEE802.3-2005 10GBASE-L and E stressed receiver conformance tests. The high-accuracy auto-calibration function assures excellent measurement reproducibility and interconnectivity.
In addition to generating IEEE and ITU-T burst data and auxiliary signals for evaluating E-PON, G-PON, and 10GE-PON optical modules, automated timing of the burst data and auxiliary signal outputs shortens evaluation times and increases evaluation quality.
Features
Wide Bandwidth 0.1 Gbit/s to 32.1 Gbit/s with configurations up to 56 Gbit/s
High-quality, Low-jitter Waveforms
Up to 32.1 Gbit/s Jitter Tolerance Tests (SJ, RJ, BUJ, SSC, 2-tone SJ)
High Input Sensitivity and Wide Phase Margin ? Signal Quality Analysis
Burst Measurement for PON and Loop Circuit measurements
Optical Interfaces
Crosstalk tests using multi-channel configuration (8 ch)
If you are not completely satisfied with your purchase, simply return the item to us in its original condition within 30 days of receipt.
Returned items should be unused and must be returned in original packaging with any enclosed documentation. We will issue a full refund on receipt, excluding the original delivery charge. Alternatively, if preferred, we will exchange the item.
VAT
Prices exclude VAT. Intra-Community transactions: Under the EU VAT Directive, B2B sales of goods across EU VAT borders is VAT zero-rated. Where VAT is charged, a rate of 23% is applied.