Keithley 2651A

High Power SourceMeter, 2000W Pulse, 200W DC, 100 fA, 40V, 20A DC/50A Pulse

Manufacturer: Keithley
Model: Keithley 2651A
Description: High Power SourceMeter, 2000W Pulse, 200W DC, 100 fA, 40V, 20A DC/50A Pulse
Data Sheet PDF: Keithley 2651A
  • Semiconductor characterization instrument
  • V or I pulse generator
  • True cur source
  • Precision electronic load
  • Source or sink:
    • 2,000W of pulsed power (±40V, ±50A)
    • 200W of DC power (±10V@±20A, ±20V@±10A, ±40V@±5A)
    • Up to 50A @ 40V with pA and uV Resolutiion
  • 1pA resolution enables precise measurement of very low leakage curs
  • 1% to 100% pulse duty cycle for pulse width modulated (PWM) drive schemes and device specific drive stimulus
  • Ability to be used as either a bench-top I-V characterization tool or as a building block component of multiple-channel I-V test systems
  • LabVIEW® driver
  • Keithley’s Test Script Processor (TSP®):
    • enables creation of custom user test scripts to further automate testing
    • supports the creation of programming sequences that allow the instrument to operate asynchronously without direct PC control
  • LXI class C compliance
  • USB port for extra data and test program storage via USB memory device
  • 2,000W of pulsed power (±40V, ±50A)
  • Up to 50A @ 40V with pA and uV Resolutiion
  • cur source
  • arbitrary waveform generator
  • measurement
  • and trigger controller
  • supports the creation of programming sequences that allow the instrument to operate asynchronously without direct PC control
  • Characterization of GaN, SiC, and other compound materials and devices
  • High speed, high precision digitization
  • High cur, high power device testing
    • No resources found for given product name.
    Keithley

    Keithley 2651A Product Overview

    The high power Keithley 2651A  SourceMeter is specifically designed to characterize and test high power electronics and it can help you improve productivity in applications across the R&D, reliability, and production spectrums, including high brightness LEDs, power semiconductors, DC-DC converters, batteries, and other high power materials, components, modules, and subassemblies.The Keithley  2651A SourceMeter offers a highly flexible, four quadrant voltage and cur source/load coupled with precision voltage and cur meters. It can be used as a:

  • V or I waveform generator
  • Precision power supply
  • Digital multimeter (DCV, DCI, ohms, and power with 5½-digit resolution)
  • Features and Specifications of the Keithley 2651A System SourceMeter include:

  • Easily connect two units (in series or parallel) to create solutions up to ±100A or ±80V
  • 1µs per point (1MHz), continuous 18-bit sampling, accurately characterizes transient behavior
  • Combines all in one instrument:
    • a precision power supply
    • cur source
    • DMM
    • arbitrary waveform generator
    • V or I pulse generator
    • measurement
    • electronic load
    • and trigger controller
  • TSP Express software to quickly and easily perform common I-V tests without programming or installing software
  • ACS Basic Edition software for semiconductor component characterization (optional). ACS Basic now features a Trace mode for generating a suite of characteristic curves.
  • Parallel test execution and precision timing when multiple Series 2600A instruments are connected together in a system
  • 14 digital I/O lines for direct interaction with probe stations, component handlers, or other automation tools
  • Applications:
    • Power semiconductor, HBLED, and optical device characterization and testing
    • Characterization of GaN, SiC, and other compound materials and devices
    • Semiconductor junction temperature characterization
    • High speed, high precision digitization
    • Electromigration studies
    • High cur, high power device testing
  • 200W of DC power (±10V@±20A, ±20V@±10A, ±40V@±5A)
  • a precision power supply
  • DMM
  • V or I pulse generator
  • electronic load
  • enables creation of custom user test scripts to further automate testing
  • Power semiconductor, HBLED, and optical device characterization and testing
  • Semiconductor junction temperature characterization
  • Electromigration studies
  •     

    No resources found for given product name.