Keithley 4200A-SCSThe Keithley 4200A-SCS Semiconductor Parameter Analyser Characterization System performs lab grade DC and pulse device characterization, real-time plotting, and analysis with high precision and sub-fem to amp resolution. The Keithley 4200A-SCS delivers synchronizing cur-voltage (I-V), capacitance-voltage (C-V) and ultra-fast pulsed I-V measurements.The Keithley 4200A-SCS Parameter Analyser reduces characterization complexity and test setup by up to 50%, providing clear, uncompromised measurement and analysis capability. Plus, embedded measurement expertise—an industry first—provides test guidance and gives you supreme confidence in your results.Highlights of the Keithley 4200A-SCS Semiconductor Parameter Analyser include:
Built-in measurement VIDEOS in English, Chinese, Japanese, and Korean
Jump start your testing with over 450 user-modifiable application tests
Automated real-time parameter extraction, data graphing, arithmetic functions
The 4200A-CVIV Multi-Switch automatically switches between I-V and C-V measurements without re-cabling or lifting the prober tips. Unlike competing products, the four-channel 4200A-CVIV display provides local visual insight for quick test setup and easy troubleshooting when unexpected results occur.
- Move C-V measurement to any device terminal without re-cabling
- User-configurable for low cur capability
- Personalize the names of output channels
- View real-time test status
Move C-V measurement to any device terminal without re-cabling
User-configurable for low cur capability
Personalize the names of output channels
View real-time test status
Features of the Keithley 4200A-SCS system include:
Intuitive, touch-screen interface running Clarius SWon Win7 embedded computer.
Unique Optional Remote PreAmps extend the resolution of SMUs to 10 aA
C-V instrument makes C-V measurements as easy as DC I-V
Pulse and pulse I-V capabilities for advanced semiconductor testing
Scope card provides integrated scope and pulse measure functionality
Self-contained PC provides fast test setup, powerful data analysis, graphing and printing, and on-board mass storage of test results.
Furnished with embedded measurement expertise and hundreds of ready-to-use application tests,
Built-in stress/measure, looping, and data analysis for point-and-click reliability testing, including five JEDEC compliant sample tests
Integrated support for a variety of LCR meters, Keithley switch matrix configurations, and both Keithley Series 3400 and Agilent 81110 pulse generators
Includes software drivers for leading analytical probers
SPecifications of the 4200A-SCS include:
Cur-Voltage (I-V) Range:
- 0.1 fA – 1 A
- 0.2 µV – 210 V
Capacitance-Voltage (C-V) Range: 1 kHz – 10 MHz ± 30V DC bias
Pulsed I-V Range: ±40 V (80 V p-p), ±800 mA 200 MSa/sec, 5 ns sampling rate
0.1 fA – 1 A
0.2 µV – 210 V
Keithley 4200A-SCS - Datasheet (3 MB)
